Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
Gianuzzi L.A., Stevie F.A.
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
年:
2004
出版社:
Springer
语言:
english
页:
377
ISBN 10:
038723313X
ISBN 13:
9780387233130
文件:
PDF, 19.45 MB
IPFS:
,
english, 2004